Capillary instabilities in solid thin films: Lines

Journal of Applied Physics

Volumn 79, Issue 10, 1996, Pages 7604-7611

  McCallum, Matthew S ^a   Voorhees, Peter W ^a   Miksis, Michael J ^a   Davis, Stephen H ^a   Wong, Harris ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009124717     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362343     Document Type: Article

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