Regular pattern formation through the retraction and pinch-off of edges during solid-state dewetting of patterned single crystal films

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 19, 2010, Pages

  Ye, Jongpil ^a   Thompson, Carl V ^a  

^a Massachusetts Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78649735532     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.193408     Document Type: Article

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