State of the art in off-line signature verification

Pattern Recognition Technologies and Applications: Recent Advances

Volumn , Issue , 2008, Pages 39-62

  Batista, Luana ^a   Rivard, Dominique ^a   Sabourin, Robert ^a   Granger, Eric ^a   Maupin, Patrick ^b  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

^b DEFENCE RESEARCH AND DEVELOPMENT CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84899389308     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.4018/978-1-59904-807-9.ch003     Document Type: Chapter

References (100)

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