Similarity measurement for off-line signature verification

Lecture Notes in Computer Science

Volumn 3644, Issue PART I, 2005, Pages 272-281

  You, Xinge ^a,c   Fang, Bin ^b,c   He, Zhenyu ^c   Tang, Yuanyan ^a,c  

^a HUBEI UNIVERSITY   (China)

^b CHONGQING UNIVERSITY   (China)

^c HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BIT ERROR RATE; DISTANCE MEASUREMENT; FEATURE EXTRACTION; GRAPH THEORY; INFORMATION RETRIEVAL; PATTERN RECOGNITION; SAMPLING;

2-D STATIC SIGNATURE GRAPHS; EUCLIDEAN DISTANCES; OFF-LINE SIGNATURE VERIFICATION; SIMILARITY MEASUREMENTS; AFFINE TRANSFORMATIONS; FEATURE REPRESENTATION; HUNT; LOCAL ALIGNMENT METHOD; PREFIX;

ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; INTELLIGENT COMPUTING;

EID: 27144491087     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/11538059_29     Document Type: Conference Paper

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