Pattern spectrum as a local shape factor for off-line signature verification

Proceedings - International Conference on Pattern Recognition

Volumn 3, Issue , 1996, Pages 43-48

  Sabourin, Robert ^a   Genest, Ginette ^a   Preteux, Francoise ^b  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

^b INSTITUT NATIONAL DES TÉLÉCOMMUNICATIONS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

SOFTWARE ENGINEERING;

EXPERIMENTAL EVALUATION; FOCUS OF ATTENTION; INTRINSIC CHARACTERISTICS; OFF-LINE SIGNATURE VERIFICATION; SHAPE REPRESENTATION; SIGNATURE DATABASE; THRESHOLD CLASSIFIERS; VISUAL PERCEPTION;

PATTERN RECOGNITION;

EID: 0004520573     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICPR.1996.546792     Document Type: Conference Paper

References (10)

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