Effects of semiconductor/dielectric interfacial properties on the electrical performance of top-gate organic transistors

Organic Electronics

Volumn 15, Issue 7, 2014, Pages 1299-1305

  Choi, Danbi ^a   An, Tae Kyu ^a   Kim, Yu Jin ^a   Chung, Dae Sung ^b   Kim, Se Hyun ^c   Park, Chan Eon ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Chung Ang University   (South Korea)

^c Yeungnam University   (South Korea)

Author keywords

Crystallinity; Interface; Morphology; Organic field effect transistor (OFET); P3HT; Top gate

Indexed keywords

GATE DIELECTRICS; INTERFACES (MATERIALS); MORPHOLOGY; ORGANIC FIELD EFFECT TRANSISTORS;

CHANNEL ROUGHNESS; CRYSTALLINITIES; ELECTRICAL PERFORMANCE; FIELD-EFFECT MOBILITIES; INTERFACIAL PROPERTY; ORGANIC TRANSISTOR; P3HT; TOP GATE;

TRANSISTORS;

EID: 84898991781     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2014.02.026     Document Type: Article

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