-
1
-
-
0033581908
-
-
H. Li, M. Eddaoudi, M. O'Keeffe, O. M. Yaghi, Nature 1999, 402, 276-279
-
(1999)
Nature
, vol.402
, pp. 276-279
-
-
Li, H.1
Eddaoudi, M.2
O'Keeffe, M.3
Yaghi, O.M.4
-
2
-
-
0037687423
-
-
N. L. Rosi, J. Eckert, M. Eddaoudi, D. T. Vodak, J. Kim, M. O'Keeffe, O. M. Yaghi, Science 2003, 300, 1127-1129
-
(2003)
Science
, vol.300
, pp. 1127-1129
-
-
Rosi, N.L.1
Eckert, J.2
Eddaoudi, M.3
Vodak, D.T.4
Kim, J.5
O'Keeffe, M.6
Yaghi, O.M.7
-
3
-
-
84876890728
-
-
M. P. Suh, H. J. Park, T. K. Prasad, D. W. Lim, Chem. Rev. 2011, 111, 782-835
-
(2011)
Chem. Rev.
, vol.111
, pp. 782-835
-
-
Suh, M.P.1
Park, H.J.2
Prasad, T.K.3
Lim, D.W.4
-
4
-
-
84876907991
-
-
K. Sumida, D. L. Rogow, J. A. Mason, T. M. McDonald, E. D. Bloch, Z. R. Herm, T. H. Bae, J. R. Long, Chem. Rev. 2011, 111, 724-781.
-
(2011)
Chem. Rev.
, vol.111
, pp. 724-781
-
-
Sumida, K.1
Rogow, D.L.2
Mason, J.A.3
McDonald, T.M.4
Bloch, E.D.5
Herm, Z.R.6
Bae, T.H.7
Long, J.R.8
-
5
-
-
0001412882
-
-
J. S. Seo, D. Whang, H. Lee, S. I. Jun, J. Oh, Y. J. Jeon, K. Kim, Nature 2000, 404, 982-986
-
(2000)
Nature
, vol.404
, pp. 982-986
-
-
Seo, J.S.1
Whang, D.2
Lee, H.3
Jun, S.I.4
Oh, J.5
Jeon, Y.J.6
Kim, K.7
-
6
-
-
42949084196
-
-
S. Horike, M. Dincǎ, K. Tamaki, J. R. Long, J. Am. Chem. Soc. 2008, 130, 5854-5855.
-
(2008)
J. Am. Chem. Soc.
, vol.130
, pp. 5854-5855
-
-
Horike, S.1
Dincǎ, M.2
Tamaki, K.3
Long, J.R.4
-
7
-
-
84878847144
-
-
J. R. Li, J. Sculley, H. C. Zhou, Chem. Rev. 2011, 111, 869-932
-
(2011)
Chem. Rev.
, vol.111
, pp. 869-932
-
-
Li, J.R.1
Sculley, J.2
Zhou, H.C.3
-
8
-
-
78649944551
-
-
S. Han, Y. Wei, C. Valente, I. Lagzi, J. J. Gassensmith, A. Coskun, J. F. Stoddart, B. A. Grzybowski, J. Am. Chem. Soc. 2010, 132, 16358-16361.
-
(2010)
J. Am. Chem. Soc.
, vol.132
, pp. 16358-16361
-
-
Han, S.1
Wei, Y.2
Valente, C.3
Lagzi, I.4
Gassensmith, J.J.5
Coskun, A.6
Stoddart, J.F.7
Grzybowski, B.A.8
-
9
-
-
84878844980
-
-
L. E. Kreno, K. Leong, O. K. Farha, M. Allendorf, R. P. Van?Duyne, J. T. Hupp, Chem. Rev. 2011, 111, 1105-1125.
-
(2011)
Chem. Rev.
, vol.111
, pp. 1105-1125
-
-
Kreno, L.E.1
Leong, K.2
Farha, O.K.3
Allendorf, M.4
Vanduyne, R.P.5
Hupp, J.T.6
-
11
-
-
84860215095
-
-
T. Prodromakis, C. Toumazou, L. Chua, Nat. Mater. 2012, 11, 478-481.
-
(2012)
Nat. Mater.
, vol.11
, pp. 478-481
-
-
Prodromakis, T.1
Toumazou, C.2
Chua, L.3
-
12
-
-
43049126833
-
-
D. B. Strukov, G. S. Snider, D. R. Stewart, R. S. Williams, Nature 2008, 453, 80-83.
-
(2008)
Nature
, vol.453
, pp. 80-83
-
-
Strukov, D.B.1
Snider, G.S.2
Stewart, D.R.3
Williams, R.S.4
-
13
-
-
31444448955
-
-
H. R. Moon, J. H. Kim, M. P. Suh, Angew. Chem. 2005, 117, 1287-1291
-
(2005)
Angew. Chem.
, vol.117
, pp. 1287-1291
-
-
Moon, H.R.1
Kim, J.H.2
Suh, M.P.3
-
14
-
-
15444367303
-
-
Angew. Chem. Int. Ed. 2005, 44, 1261-1265
-
(2005)
Angew. Chem. Int. Ed.
, vol.44
, pp. 1261-1265
-
-
-
15
-
-
83455236786
-
-
A. Dragässer, O. Shekhah, O. Zybaylo, C. Shen, M. Buck, C. Woll, D. Schlettwein, Chem. Commun. 2012, 48, 663-665.
-
(2012)
Chem. Commun.
, vol.48
, pp. 663-665
-
-
Dragässer, A.1
Shekhah, O.2
Zybaylo, O.3
Shen, C.4
Buck, M.5
Woll, C.6
Schlettwein, D.7
-
16
-
-
77957370002
-
-
M. Tonigold, Y. Lu, B. Bredenkötter, B. Rieger, S. Bahnmüller, J. Hitzbleck, G. Langstein, D. Volkmer, Angew. Chem. 2009, 121, 7682-7687
-
(2009)
Angew. Chem.
, vol.121
, pp. 7682-7687
-
-
Tonigold, M.1
Lu, Y.2
Bredenkötter, B.3
Rieger, B.4
Bahnmüller, S.5
Hitzbleck, J.6
Langstein, G.7
Volkmer, D.8
-
17
-
-
70349981202
-
-
Angew. Chem. Int. Ed. 2009, 48, 7546-7550.
-
(2009)
Angew. Chem. Int. Ed.
, vol.48
, pp. 7546-7550
-
-
-
18
-
-
70349327378
-
-
S. Bureekaew, S. Horike, M. Higuchi, M. Mizuno, T. Kawamura, D. Tanaka, N. Yanai, S. Kitagawa, Nat. Mater. 2009, 8, 831-836.
-
(2009)
Nat. Mater.
, vol.8
, pp. 831-836
-
-
Bureekaew, S.1
Horike, S.2
Higuchi, M.3
Mizuno, M.4
Kawamura, T.5
Tanaka, D.6
Yanai, N.7
Kitagawa, S.8
-
19
-
-
70749089003
-
-
J. A. Hurd, R. Vaidhyanathan, V. Thangadurai, C. I. Ratcliffe, I. L. Moudrakovski, G. K. H. Shimizu, Nat. Chem. 2009, 1, 705-710.
-
(2009)
Nat. Chem.
, vol.1
, pp. 705-710
-
-
Hurd, J.A.1
Vaidhyanathan, R.2
Thangadurai, V.3
Ratcliffe, C.I.4
Moudrakovski, I.L.5
Shimizu, G.K.H.6
-
20
-
-
84858167699
-
-
W. I. Park, J. M. Yoon, M. Park, J. Lee, S. K. Kim, J. W. Jeong, K. Kim, H. Y. Jeong, S. Jeon, K. S. No, J. Y. Lee, Y. S. Jung, Nano Lett. 2012, 12, 1235-1240.
-
(2012)
Nano Lett.
, vol.12
, pp. 1235-1240
-
-
Park, W.I.1
Yoon, J.M.2
Park, M.3
Lee, J.4
Kim, S.K.5
Jeong, J.W.6
Kim, K.7
Jeong, H.Y.8
Jeon, S.9
No, K.S.10
Lee, J.Y.11
Jung, Y.S.12
-
21
-
-
79960214472
-
-
J. Song, Z. Yan, C. Xu, W. Wu, Z. L. Wang, Nano Lett. 2011, 11, 2829-2834.
-
(2011)
Nano Lett.
, vol.11
, pp. 2829-2834
-
-
Song, J.1
Yan, Z.2
Xu, C.3
Wu, W.4
Wang, Z.L.5
-
22
-
-
78650704902
-
-
R. A. Smaldone, R. S. Forgan, H. Furukawa, J. J. Gassensmith, A. M. Z. Slawin, O. M. Yaghi, J. F. Stoddart, Angew. Chem. 2010, 122, 8812-8816
-
(2010)
Angew. Chem.
, vol.122
, pp. 8812-8816
-
-
Smaldone, R.A.1
Forgan, R.S.2
Furukawa, H.3
Gassensmith, J.J.4
Slawin, A.M.Z.5
Yaghi, O.M.6
Stoddart, J.F.7
-
23
-
-
78149463759
-
-
Angew. Chem. Int. Ed. 2010, 49, 8630-8634.
-
(2010)
Angew. Chem. Int. Ed.
, vol.49
, pp. 8630-8634
-
-
-
24
-
-
84882275512
-
-
Y. H. Wei, S. B. Han, D. A. Walker, P. E. Fuller, B. A. Grzybowski, Angew. Chem. 2012, 124, 7553-7557
-
(2012)
Angew. Chem.
, vol.124
, pp. 7553-7557
-
-
Wei, Y.H.1
Han, S.B.2
Walker, D.A.3
Fuller, P.E.4
Grzybowski, B.A.5
-
25
-
-
84864184807
-
-
Angew. Chem. Int. Ed. 2012, 51, 7435-7439.
-
(2012)
Angew. Chem. Int. Ed.
, vol.51
, pp. 7435-7439
-
-
-
26
-
-
0033584805
-
-
J. Chen, M. A. Reed, A. M. Rawlett, J. M. Tour, Science 1999, 286, 1550-1552.
-
(1999)
Science
, vol.286
, pp. 1550-1552
-
-
Chen, J.1
Reed, M.A.2
Rawlett, A.M.3
Tour, J.M.4
-
27
-
-
34548732605
-
-
Q. Tang, H. K. Moon, Y. Lee, S. M. Yoon, H. J. Song, H. Lim, H. C. Choi, J. Am. Chem. Soc. 2007, 129, 11018-11019.
-
(2007)
J. Am. Chem. Soc.
, vol.129
, pp. 11018-11019
-
-
Tang, Q.1
Moon, H.K.2
Lee, Y.3
Yoon, S.M.4
Song, H.J.5
Lim, H.6
Choi, H.C.7
-
29
-
-
46749093701
-
-
J. J. Yang, M. D. Pickett, X. Li, D. A. A. Ohlberg, D. R. Stewart, R. S. Williams, Nat. Nanotechnol. 2008, 3, 429-433.
-
(2008)
Nat. Nanotechnol.
, vol.3
, pp. 429-433
-
-
Yang, J.J.1
Pickett, M.D.2
Li, X.3
Ohlberg, D.A.A.4
Stewart, D.R.5
Williams, R.S.6
-
30
-
-
67650224663
-
-
T. Berzina, A. Smerieri, M. Bernabò, A. Pucci, G. Ruggeri, V. Erokhin, M. P. Fontana, J. Appl. Phys. 2009, 105, 124515.
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 124515
-
-
Berzina, T.1
Smerieri, A.2
Bernabò, M.3
Pucci, A.4
Ruggeri, G.5
Erokhin, V.6
Fontana, M.P.7
-
31
-
-
84975424445
-
-
R. Memming, F. Mollers, G. Neumann, J. Electrochem. Soc. 1970, 117, 451-457.
-
(1970)
J. Electrochem. Soc.
, vol.117
, pp. 451-457
-
-
Memming, R.1
Mollers, F.2
Neumann, G.3
-
32
-
-
17144456998
-
-
X. Y. Gao, S. Y. Wang, J. Li, Y. X. Zheng, R. J. Zhang, P. Zhou, Y. M. Yang, L. Y. Chen, Thin Solid Films 2004, 455-456, 438-442.
-
(2004)
Thin Solid Films
, vol.4554
, pp. 438-442
-
-
Gao, X.Y.1
Wang, S.Y.2
Li, J.3
Zheng, Y.X.4
Zhang, R.J.5
Zhou, P.6
Yang, Y.M.7
Chen, L.Y.8
-
35
-
-
84858037338
-
-
S. Han, Y. Wei, C. Valente, R. S. Forgan, J. J. Gassensmith, R. A. Smaldone, H. Nakanishi, A. Coskun, J. F. Stoddart, B. A. Grzybowski, Angew. Chem. 2011, 123, 290-293
-
(2011)
Angew. Chem.
, vol.123
, pp. 290-293
-
-
Han, S.1
Wei, Y.2
Valente, C.3
Forgan, R.S.4
Gassensmith, J.J.5
Smaldone, R.A.6
Nakanishi, H.7
Coskun, A.8
Stoddart, J.F.9
Grzybowski, B.A.10
-
37
-
-
33747502548
-
-
C. J. Campbell, S. K. Smoukov, K. J. M. Bishop, E. Baker, B. A. Grzybowski, Adv. Mater. 2006, 18, 2004-2008.
-
(2006)
Adv. Mater.
, vol.18
, pp. 2004-2008
-
-
Campbell, C.J.1
Smoukov, S.K.2
Bishop, K.J.M.3
Baker, E.4
Grzybowski, B.A.5
-
38
-
-
84898935172
-
-
Pinched hysteresis is characteristic of a memristor. Of the twenty devices tested, 90 % exhibited this behavior; the remaining 10 % exhibited either no current or other non-memristive behavior, which is likely to be due to the presence of structural defects (for example, cracks) within the MOF that limit charge transport.
-
Pinched hysteresis is characteristic of a memristor. Of the twenty devices tested, 90 % exhibited this behavior; the remaining 10 % exhibited either no current or other non-memristive behavior, which is likely to be due to the presence of structural defects (for example, cracks) within the MOF that limit charge transport.
-
-
-
|