Correlation between soft annealing conditions and structural, microstructural, morphological, and optical properties of CuInS2 thin films prepared by sulfurization of stacked precursor

Journal of Crystal Growth

Volumn 394, Issue , 2014, Pages 49-54

  Shin, Seung Wook ^a   Gurav, K V ^b   Gang, Myeng Gil ^b   Suryawanshi, M P ^b,d   Patil, P S ^b,d   Agawane, G L ^b   Jeoung, Chae Hwan ^e   Yun, Jae Ho ^f   Lee, Jeong Yong ^a,c   Kim, Jin Hyeok ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Chonnam National University   (South Korea)

^c Institute for Basic Science   (South Korea)

^d SHIVAJI UNIVERSITY   (India)

^e Solar City Center   (South Korea)

^f Korea Institute of Energy Research (KIER)   (South Korea)

Author keywords

A1. High resolution X ray diffraction; B1. Inorganic compounds; B2. Semiconducting materials; B3. Solar cells

Indexed keywords

HIGH RESOLUTION X RAY DIFFRACTION; METALLIC PRECURSOR; MICRO-STRUCTURAL; SECONDARY PHASIS; SEMICONDUCTING MATERIALS; STACKED PRECURSORS; TETRAGONAL STRUCTURE; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;

INORGANIC COMPOUNDS; OPTICAL PROPERTIES; PHOTOELECTRONS; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

FILM PREPARATION;

EID: 84897675289     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2014.02.001     Document Type: Article

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