Ex situ structural characterization during the formation of CuInS 2 thin films

Acta Materialia

Volumn 59, Issue 1, 2011, Pages 349-354

  Tsai, Chia Hung ^a   Ting, Jyh Ming ^a   Wang, Rui Ren ^b  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b TAIWAN TEXTILE RESEARCH INSTITUTE   (Taiwan)

Author keywords

Raman; TEM; Thin films

Indexed keywords

COATED GLASS SUBSTRATES; EX SITU; IN-SITU; METASTABLE STRUCTURES; RAMAN; STRUCTURAL CHARACTERIZATION; TEM; X-RAY DIFFRACTOMETRY; XRD;

COPPER COMPOUNDS; METASTABLE PHASES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

COPPER;

EID: 78049526938     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.09.040     Document Type: Article

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