Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping

Journal of Applied Crystallography

Volumn 47, Issue 2, 2014, Pages 762-769

  Chahine, Gilbert André ^a   Richard, Marie Ingrid ^a,b   Homs Regojo, Roberto Arturo ^a   Tran Caliste, Thu Nhi ^a   Carbone, Dina ^a   Jaques, Vincent Louis Robert ^a   Grifone, Raphael ^a   Boesecke, Peter ^a   Katzer, Jens ^c   Costina, Ioan ^c   Djazouli, Hamid ^a   Schroeder, Thomas ^c   Schülli, Tobias Urs ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c INNOVATIONS FOR HIGH PERFORMANCE MICROELECTRONICS   (Germany)

Author keywords

data analysis software; lattice orientation; reciprocal space mapping; scanning probe microscopy; scanning X ray diffraction microscopy; strain

Indexed keywords

IMAGING TECHNIQUES; NUCLEAR INSTRUMENTATION; SCANNING PROBE MICROSCOPY; SENSITIVITY ANALYSIS; STRAIN; X RAY DIFFRACTION;

ASSOCIATED SOFTWARES; CALCULATION SOFTWARE; DATA ANALYSIS SOFTWARES; LATTICE ORIENTATIONS; RECIPROCAL SPACE MAPPING; STRAIN ORIENTATIONS; TWO-DIMENSIONAL DETECTORS; X-RAY DIFFRACTION MICROSCOPY;

TWO DIMENSIONAL;

EID: 84897448976     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576714004506     Document Type: Article

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