Interface reactions of Ag@TiO2 nanocomposite films

Materials Chemistry and Physics

Volumn 145, Issue 1-2, 2014, Pages 90-98

  Zuo, Juan ^a,b   Rao, Jiancun ^c,d   Eggeler, Gunther ^c  

^a XIAMEN UNIVERSITY OF TECHNOLOGY   (China)

^b MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^c RUHR UNIVERSITY BOCHUM   (Germany)

^d HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Interface; Nanostructures; Sputtering; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; FILM GROWTH; INTERFACES (MATERIALS); NANOSTRUCTURES; OXIDES; PHOTOELECTRONS; SILVER OXIDES; SPUTTERING; THIN FILMS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

AG NANOPARTICLE; DEPOSITION PROCESS; FILM MATRIX; FILM STRUCTURE; INTERFACE REACTIONS; NUCLEATION AND GROWTH; REFLECTION SPECTRA; SPUTTERING PROCESS;

SILVER;

EID: 84896393992     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2014.01.041     Document Type: Article

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