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Volumn 79, Issue 1, 2001, Pages 68-70

Atomic force microscopy and X-ray photoelectron spectroscopy study on nanostructured silver thin films irradiated by atomic oxygen

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; GRAIN SIZE AND SHAPE; IRRADIATION; NANOSTRUCTURED MATERIALS; OXYGEN; SILVER; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0035094525     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00562-6     Document Type: Article
Times cited : (15)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.