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Volumn 79, Issue 1, 2001, Pages 68-70
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Atomic force microscopy and X-ray photoelectron spectroscopy study on nanostructured silver thin films irradiated by atomic oxygen
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
GRAIN SIZE AND SHAPE;
IRRADIATION;
NANOSTRUCTURED MATERIALS;
OXYGEN;
SILVER;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ATOMIC OXYGEN;
NANOSTRUCTURED SILVER THIN FILMS;
METALLIC FILMS;
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EID: 0035094525
PISSN: 09215107
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-5107(00)00562-6 Document Type: Article |
Times cited : (15)
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References (15)
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