Combining atomistic simulation and x-ray diffraction for the characterization of nanostructures: A case study on fivefold twinned nanowires

ACS Nano

Volumn 8, Issue 2, 2014, Pages 1629-1638

  Niekiel, Florian ^a   Bitzek, Erik ^a   Spiecker, Erdmann ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

atomistic simulation; disclination; fivefold twinned nanowires; X ray diffraction

Indexed keywords

EID: 84894639408     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn405941m     Document Type: Article

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