TEM preparation method for site- and orientation-specific sectioning of individual anisotropic nanoparticles based on shadow-FIB geometry

Ultramicroscopy

Volumn 113, Issue , 2012, Pages 165-170

  Vieweg, Benito F ^a   Butz, Benjamin ^a   Peukert, Wolfgang ^a   Klupp Taylor, Robin N ^a   Spiecker, Erdmann ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

FIB; High resolution transmission electron microscopy; Nanoparticles; Nanorods; Patchy particles; TEM preparation

Indexed keywords

ANISOTROPIC NANOPARTICLES; ANISOTROPIC NANOSTRUCTURES; ATOMIC SCALE; FIB; GAIN INFORMATION; NANO-METER SCALE; PREPARATION METHOD; SENSITIVE FILMS; SILVER NANORODS; SIMULTANEOUS OBSERVATION; SITE-SPECIFIC; TWIN STRUCTURE;

ANISOTROPY; ELECTRON BEAMS; NANORODS; PLATINUM; SILVER; TRANSMISSION ELECTRON MICROSCOPY;

NANOPARTICLES;

NANOPARTICLE;

ACCURACY; ANALYTIC METHOD; ANISOTROPY; ARTICLE; ELECTRON BEAM; FEASIBILITY STUDY; FOCUSED ION BEAM METHOD; GEOMETRY; NANOANALYSIS; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84856060151     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.11.015     Document Type: Article

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