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Volumn 3, Issue 6, 2004, Pages 757-763

X-ray diffraction analysis of nanoparticles: Recent developments, potential problems and some solutions

Author keywords

Oxides; X ray diffraction

Indexed keywords

CRYSTALLINE MATERIALS; MICROSTRUCTURE; OXIDES; PROBLEM SOLVING; SIZE DETERMINATION; SOLUTIONS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 21144452114     PISSN: 0219581X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0219581X04002620     Document Type: Article
Times cited : (33)

References (13)
  • 5
    • 3242782065 scopus 로고    scopus 로고
    • Karlsruhe, Germany
    • Bruker AXS. TOPAS V2.1 user manual, Karlsruhe, Germany, 2003.
    • (2003) TOPAS V2.1 User Manual
  • 7
    • 25444489939 scopus 로고    scopus 로고
    • Report on the size/strain round robin
    • International Union of Crystallography
    • D. Balzar and N. C. Popa, Report on the size/strain round robin, Commission of Powder Diffraction Newsletter, No. 28, International Union of Crystallography (2002), pp. 14-15.
    • (2002) Commission of Powder Diffraction Newsletter , vol.28 , pp. 14-15
    • Balzar, D.1    Popa, N.C.2
  • 12
    • 0004326059 scopus 로고
    • Oxford Science Publications, Oxford
    • R. A. Young, The Rietveld Method (Oxford Science Publications, Oxford, 1995).
    • (1995) The Rietveld Method
    • Young, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.