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Volumn 122, Issue , 2014, Pages 37-40

TEM analysis of Si thin films prepared by diode laser induced solid phase epitaxy at high temperatures

Author keywords

IR laser; Random nucleation and growth; Silicon; Solid phase epitaxy; TEM analysis; Time resolved reflectivity measurements

Indexed keywords


EID: 84894590188     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2014.02.006     Document Type: Article
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.