Spectral optical functions of silicon in the range of 1.13-4.96 eV at elevated temperatures

International Journal of Heat and Mass Transfer

Volumn 40, Issue 7, 1997, Pages 1591-1600

  Sun, Byung K ^a,b   Zhang, Xiang ^a   Grigoropoulos, Costas P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Samsung Electro Mechanics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; FUNCTIONS; HIGH TEMPERATURE EFFECTS; LIGHT ABSORPTION; LIGHT REFLECTION; REFRACTIVE INDEX; SPECTRUM ANALYSIS;

HIGH TEMPERATURE SPECTRAL OPTICAL FUNCTIONS; NORMAL INCIDENCE REFLECTANCE;

SILICON;

EID: 0031148295     PISSN: 00179310     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0017-9310(96)00205-0     Document Type: Article

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