Unified reliability modeling of Ge-rich phase change memory for embedded applications

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2013, Pages

  Ciocchini, N ^a   Palumbo, E ^b   Borghi, M ^b   Zuliani, P ^b   Annunziata, R ^b   Ielmini, D ^a  

^a POLITECNICO DI MILANO   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84894351332     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2013.6724681     Document Type: Conference Paper

References (12)

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