Statistical analysis and modeling of programming and retention in PCM arrays

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2007, Pages 311-314

  Mantegazza, D ^a   Jelmini, D ^a   Varesi, E ^b   Pirovano, A ^b   Lacaita, A L ^a  

^a POLITECNICO DI MILANO   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DEVICES; STATISTICAL METHODS;

ACTIVE MATERIALS; AND MODELING; COMPOSITION FLUCTUATIONS; EMPIRICAL MODELING; IN PHASE; RETENTION MODELLING; RETENTION STATISTICS; STATISTICAL ANALYSIS;

PHASE CHANGE MEMORY;

EID: 50249169390     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2007.4418933     Document Type: Conference Paper

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