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Advanced Functional Materials

Volumn 24, Issue 7, 2014, Pages 925-933

Understanding the microscopic origin of the very high charge mobility in PBTTT: Tolerance of thermal disorder

(2) Liu, Tao a Troisi, Alessandro a

a UNIVERSITY OF WARWICK (United Kingdom)

Author keywords

charge mobility; electronic structure; polymers; transistors; trap states

Indexed keywords

EID: 84894049313 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.201302069 Document Type: Article

Times cited : (65)

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