Annealing effect on the thermoelectric properties of Bi2Te 3 thin films prepared by thermal evaporation method

Journal of Nanomaterials

Volumn 2013, Issue , 2013, Pages

  Lin, Jyun Min ^a   Chen, Ying Chung ^a   Lin, Chi Pi ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; CRYSTALLINE STRUCTURE; ELECTRICAL CONDUCTIVITY; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; THERMAL EVAPORATION METHOD; THERMAL EVAPORATION PROCESS; THERMO-ELECTRIC MATERIALS; THERMOELECTRIC PROPERTIES;

ANNEALING; ELECTRIC POWER FACTOR; SEEBECK COEFFICIENT; THERMAL EVAPORATION; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; X RAY DIFFRACTION;

THIN FILMS;

EID: 84893783454     PISSN: 16874110     EISSN: 16874129     Source Type: Journal    
DOI: 10.1155/2013/201017     Document Type: Article

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