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Volumn 2002-January, Issue , 2002, Pages 535-539
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Thermoelectric microdevice fabrication process and evaluation at the Jet Propulsion Laboratory (JPL)
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE COUPLED DEVICES;
COOLING;
FABRICATION;
INFRARED IMAGING;
LIGHT SOURCES;
MICROELECTRONICS;
PHOTORESISTS;
REDUCTION;
SEMICONDUCTOR MATERIALS;
SILICON OXIDES;
WASTE HEAT;
CHARGE COUPLED DEVICE DETECTORS;
ELECTROCHEMICAL DEPOSITION;
JET PROPULSION LABORATORY;
MICROELECTRONICS INDUSTRY;
OXIDIZED SILICON SUBSTRATES;
POWER MANAGEMENT AND DISTRIBUTIONS;
TEMPERATURE DIFFERENTIAL;
THERMOELECTRIC CONVERTER;
FIGHTER AIRCRAFT;
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EID: 84949775707
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ICT.2002.1190373 Document Type: Conference Paper |
Times cited : (48)
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References (10)
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