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Volumn 2002-January, Issue , 2002, Pages 535-539

Thermoelectric microdevice fabrication process and evaluation at the Jet Propulsion Laboratory (JPL)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; COOLING; FABRICATION; INFRARED IMAGING; LIGHT SOURCES; MICROELECTRONICS; PHOTORESISTS; REDUCTION; SEMICONDUCTOR MATERIALS; SILICON OXIDES; WASTE HEAT;

EID: 84949775707     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICT.2002.1190373     Document Type: Conference Paper
Times cited : (48)

References (10)
  • 6
    • 0005534799 scopus 로고    scopus 로고
    • Thermoelectric materials 1998
    • T.M. Tritt, M.G. Kanatzidis, H.B. Lyon, and G.D. Mahan, eds
    • J.-P. Fleurial, et al., Thermoelectric Materials 1998, T.M. Tritt, M.G. Kanatzidis, H.B. Lyon, and G.D. Mahan, eds., MRS Volume 545 (1998).
    • (1998) MRS , vol.545
    • Fleurial, J.-P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.