Growth of Bi2Te3 and Sb2Te3 thin films by MOCVD

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 64, Issue 1, 1999, Pages 19-24

  Giani, A ^a   Boulouz, A ^a   Pascal Delannoy, F ^a   Foucaran, A ^a   Charles, E ^a   Boyer, A ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY ALLOYS; BISMUTH ALLOYS; FILM GROWTH; METALLIC FILMS; METALLIC SUPERLATTICES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PELTIER EFFECT; SCANNING ELECTRON MICROSCOPY; SEEBECK EFFECT; SEMICONDUCTOR GROWTH; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

TRIETHYLANTIMONY; TRIMETHYLBISMUTH;

SEMICONDUCTOR SUPERLATTICES;

EID: 0033311897     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00142-7     Document Type: Article

References (9)

1. Noro H., Sato K., Kagechika H. J. Appl. Phys. 73:1993;1252.
2. Völklein F., Baier V., Dillner U., Kessler E. Thin Solid Films. 187:1990;253.
3. Foucaran A., Sackda A., Giani A., Pascal-Delannoy E., Boyer A. Mat. Sci. Eng. B. 52:1998;154-161.
4. Venkatasubramanian R., Colpitts T., Watko E., Lamvik M., El-Masry N. J. Crystal Growth. 170:1997;817-821.
5. Giani A., Pascal-Delannoy F., Foucaran A., Boyer A., Gschwind M., Ancey P. Thin Solid Films. 303:1997;1-3.
6. Giani A., Boulouz A., Pascal-Delannoy F., Foucaran A., Boyer A. Thin Solid Films. 315:1998;99-103.
7. Hicks L.D., Harman T.C., Dresselhaus M.S. Appl. Phys. Lett. 63:1993;3230.
8. Ohsugi I.J., Kjima T., Sakata M., Yamanashi M., Nishida I.A. J. Appl. Phys. 76:1994;4.
9. George J., Pradeep B. Solid State Communication. 56, N 1:1985;117-120.