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Volumn , Issue , 1999, Pages 368-375

On the design of self-checking functional units based on Shannon circuits

Author keywords

[No Author keywords available]

Indexed keywords

FAULT SECURE; FUNCTIONAL UNITS; LOW POWER; SELF CHECKING; SHANNON; STUCK-AT FAULTS; TIME REDUNDANCY; TOTALLY SELF-CHECKING;

EID: 84893612485     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1999.761148     Document Type: Conference Paper
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.