Thermoelectric and photoconductivity properties of zinc oxide-tin oxide binary systems prepared by spray pyrolysis

Thin Solid Films

Volumn 552, Issue , 2014, Pages 39-45

  Ardyanian, M ^a   Moeini, M ^a   Azimi Juybari, H ^a  

^a DAMGHAN UNIVERSITY   (Iran)

Author keywords

Atomic force microscopy; Binary system; Photoconductivity; Spray pyrolysis; Thermoelectricity; Tin oxide; X ray diffraction; Zinc oxide

Indexed keywords

BAND GAP NARROWING; BINARY SYSTEMS; ELECTRICAL CONDUCTIVITY; OPTICAL TRANSPARENCY; SEEBECK EFFECT MEASUREMENTS; SPRAY PYROLYSIS METHOD; THERMOELECTRIC MEASUREMENTS; UV-VIS-NIR SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY; ELECTRIC POWER FACTOR; ELECTRIC PROPERTIES; FILM PREPARATION; HALL EFFECT; INFRARED DEVICES; PHOTOCONDUCTIVITY; SCANNING ELECTRON MICROSCOPY; SPRAY PYROLYSIS; SUBSTRATES; SYSTEMS (METALLURGICAL); THERMOELECTRICITY; THIN FILMS; TIN OXIDES; X RAY DIFFRACTION; ZINC; ZINC OXIDE;

TIN;

EID: 84892811101     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2013.12.010     Document Type: Article

References (48)

1. P. Görrn, F. Ghaffari, T. Riedl, and W. Kowalsky Solid State Electron. 53 2009 329
2. E. Orgiu, I. Manunza, M. Sanna, P. Cosseddu, and A. Bonfiglio Thin Solid Films 516 2008 1533
3. D.C. Paine, B. Yaglioglu, Z. Beiley, and S. Lee Thin Solid Films 516 2008 5894
4. G. Lavareda, C. Nunesde Carvalho, E. Fortunato, A.R. Ramos, E. Alves, O. Conde, and A. Amaral J. Non-Cryst. Solids 352 2006 2311
5. K. Tonooka, H. Bando, and Y. Aiura Thin Solid Films 445 2003 327
6. D.S. Ginley, and C. Bright Mater. Res. Bull. 25 2000 15
7. H. China, S. Campbell, and O. Kesler J. Power Sources 161 2006 893
8. N.G. Patel, and V.S. Vaishnav Sensors Actuators B 96 2003 180
9. T. Feng, A. Ghosh, and C. Fishman J. Appl. Phys. 50 1979 4972
10. M. Sawada, M. Higuchi, S. Kondo, and H. Saka J. Appl. Phys. 40 2001 3332
11. P.K.H. Ho, J.S. Kim, J.H. Burroughes, H. Becker, S.F.Y. Li, T.M. Brown, F. Cacialli, and R.H. Friend Nature (London) 404 2000 481
12. D.G. Thomas J. Phys. Chem. Solids 15 1960 86
13. P. Sharma, A. Mansingh, and k. Sreenvias Appl. Phys. Lett. 80 2002 553
14. C. Agashe, O. Kluth, G. Schope, H. siekmann, J. Hupkes, and B. Rech Thin solid films 442 2003 167
15. Z.L. Wang Adv. Mater. 19 2007 889
16. F. Grasset, O. Lavastre, C. Baudet, T. Sasaki, and H. Haneda J. Colloid Interface Sci. 317 2008 493
17. X. Ren, D. Han, D. Chen, and F. Tang Mater. Res. Bull. 42 2007 807
18. Y.H. Ni, X.W. Wei, J.M. Hong, and Y. Ye Solid-State Materials for Advanced Technology. 121 2005 42
19. T. Feng, A. Ghosh, and C. Fishman J. Appl. Phys. 50 1979 4972
20. M. Ristiæ, S. Musiæ, M. Ivanda, and S. Popoviæ J. Alloys Compd. 397 2005 L1
21. S. Chang, and A. Sakai Mater. Lett. 53 2002 432
22. T. Liu, O. Sakurai, N. Mizutani, and M. Kato J. Mater. Sci. 21 1986 3698
23. B. Chiou, Y.J. Tsai, and J. Duh J. Mater. Sci. Lett. 7 1988 785
24. J.-J. Wu, and S.-C. Liu Adv. Mater. 14 2002 215
25. Y.F. Chen, D.M. Bagnall, H.J. Koh, K.T. Park, K. Hiraga, Z.Q. Zhu, and T. Yao J. Appl. Phys. 84 1998 3912
26. D.G. Lamas, G.E. Lascalea, and N.E. Walsoc J. Eur. Ceram. Soc. 18 1998 1217
27. S. Badhuri, and S.B. Badhuri Nanostruct. Mater. 8 1997 755
28. R.E. Juarez, and D.G. James J. Eur. Ceram. Soc. 20 2000 133
29. P.R. Patil, and S.S. Joshi Mater. Chem. Phys. 105 2007 354
30. B. Baruwati, D.K. Kumar, and S.V. Manorama Sensors Actuators B 119 2006 676
31. E. Cetinorgu, S. Goldsmith, and R.L. Boxman J. Phys. D. Appl. Phys. 39 2006 1878
32. E. Cetinorgu, S. Goldsmith, and R.L. Boxman J. Phys. D. Appl. Phys. 39 2006 1878
33. W. Yang, R.D. Vispute, S. Choopun, R.P. Sharma, T. Venkatesan, and H. Shen Appl. Phys. Lett. 78 2001 2787
34. H. Liu, V. Avrutin, N. Izyumskaya, Ü. Özgür, and H. Morkoç Superlattice. Microst. 48 2010 458
35. H. Colder, E. guilmeau, C. Harnois, S. Marinel, R. Retoux, and E. Savary J. Eur. Ceram. Soc. 31 2011 2957
36. S.T. Shishiyanu, T.S. Shishiyanu, and O.I. Lupan Sensors Actuators B 107 2005 379
37. R. Swanepolel J. Phys. E; Sci. instrum. 16 1983 1214
38. M.M. Bagheri-Mohagheghi, N. Shahtahmasebi, M.R. Alinejad, A. Youssefi, and M. Shokooh-Saremi Physica B 403 2008 2431
39. F. Moharrami, M.M. Bagheri-Mohagheghi, and H. Azimi-Juybari Thin solid films 520 2012 6503
40. S. lwanaga, M. Marciniak, R.B. Darling, and F.S. Ohuchi J. App. Phys. 101 2007 123709
41. K. Park, and K.Y. Ko J. Alloys Compd. 430 2007 200
42. C.M. Bhandari, and D.M. Rowe D.M. Rowe, CRC Handbook of Thermoelectrics 1955 CRC Press Boca Raton 43
43. Joint Committee on Powder Diffraction Standards, Powder Diffraction File No. JCPDS-41-1445) (ICSD data).
44. R.A. Abram, G.J. Rees, and B.L.H. Wilson Adv. Phys. 27 1978 799
45. H. Yabuta, n. kaji, R. hayashi, H. Kumomi, K. nomura, T. Kamiya, M. Hirano, and Hideo Hosono Appl. Phys. Lett. 97 2010 072111
46. M. Ohtaki, T. Tsubota, K. Eguchi, and H. Arai J. Appl. Phys. 79 1996 1816
47. H. Maeda, Y. Nakao, and K. Hojo Proceedings of the 17th International Conference on Thermoelectrics 1998 416
48. Kwok k. Ng Complete Guide To Semiconductor Devices international edition 1995 McGraw-Hill press 395