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Volumn 520, Issue 21, 2012, Pages 6503-6509
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Study of structural, electrical, optical, thermoelectric and photoconductive properties of S and Al co-doped SnO 2 semiconductor thin films prepared by spray pyrolysis
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Author keywords
Microstructure; Optical properties; P type conductivity; Spray pyrolysis; Sulfur doping; Thin films; Tin oxide
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Indexed keywords
AL CONTENT;
AL-CONCENTRATION;
ATOMIC RATIO;
BAND-GAP VALUES;
CO-DOPED SNO;
GRAIN SIZE;
HALL EFFECT MEASUREMENT;
MAJORITY CARRIERS;
MINIMUM RESISTANCE;
P-TYPE CONDUCTIVITY;
PHOTOCONDUCTIVE PROPERTIES;
S-DOPED;
SEMICONDUCTOR THIN FILMS;
SMALL CRACK;
SPRAY SOLUTIONS;
SULFUR DOPING;
THERMOELECTRIC MEASUREMENTS;
ALUMINUM;
ELECTRIC PROPERTIES;
MICROSTRUCTURE;
OPTICAL PROPERTIES;
PHOTOCONDUCTIVITY;
SCANNING ELECTRON MICROSCOPY;
SPRAY PYROLYSIS;
SULFUR;
THIN FILMS;
TIN;
TIN OXIDES;
X RAY DIFFRACTION ANALYSIS;
SEMICONDUCTOR DOPING;
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EID: 84864748265
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2012.06.075 Document Type: Article |
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Times cited : (25)
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References (22)
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