Quantitative compositional profiling of conjugated quantum dots with single atomic layer depth resolution via time-of-flight medium-energy ion scattering spectroscopy

Analytical Chemistry

Volumn 86, Issue 2, 2014, Pages 1091-1097

  Jung, Kang Won ^a   Yu, Hyunung ^b   Min, Won Ja ^c   Yu, Kyu Sang ^c   Sortica, M A ^d   Grande, Pedro L ^d   Moon, Daewon ^a  

^a Daegu Gyeongbuk Institute of Science and Technology   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

^c K MAC Inc   (South Korea)

^d FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ACCEPTANCE ANGLE; CDSE/ZNS QUANTUM DOTS; COLLECTION EFFICIENCY; CORE SHELL STRUCTURE; DEPTH RESOLUTION; LAYER STRUCTURES; MEDIUM ENERGY ION SCATTERING; ORDERS OF MAGNITUDE;

COMPUTER SOFTWARE; PHOTOELECTRONS; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC SULFIDE;

DEPTH PROFILING;

EID: 84892741230     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac402753j     Document Type: Article

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