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Applied Physics Letters

Volumn 103, Issue 26, 2013, Pages

In situ tensile and creep testing of lithiated silicon nanowires

(4) Boles, Steven T a Thompson, Carl V b Kraft, Oliver a Mönig, Reiner a,c

a KARLSRUHE INSTITUTE OF TECHNOLOGY (Germany)

b Massachusetts Institute of Technology Cambridge (United States)

c HELMHOLTZ INSTITUTE ULM HIU (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CAPACITIES; CYCLING CONDITIONS; DESIGN AND CONSTRUCTION; LINEAR DEPENDENCE; MATERIAL TRANSPORT; SILICON NANOWIRES; STRAIN RATE DEPENDENCE; VISCOUS DEFORMATION;

CREEP TESTING; LITHIUM; NANOWIRES; STRAIN RATE; TENSILE STRENGTH; WIRE; YIELD STRESS;

SILICON;

EID: 84891609116 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4858394 Document Type: Article

Times cited : (51)

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