Source-based strengthening of sub-micrometer Al fibers

Acta Materialia

Volumn 60, Issue 3, 2012, Pages 977-983

  Mompiou, Frédéric ^a   Legros, Marc ^a   Sedlmayr, Andreas ^b   Gianola, Daniel S ^c   Caillard, Daniel ^a   Kraft, Oliver ^b  

^a CEMES CNRS   (France)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

Aluminum fibers; In situ scanning electron microscopy (SEM); In situ transmission electron microscopy (TEM); Mechanical properties; Size effect

Indexed keywords

ALUMINUM FIBERS; CRYSTAL SIZE; EUTECTIC ALLOYS; HIGH STRESS; IN SITU TRANSMISSION ELECTRON MICROSCOPY (TEM); IN-SITU; IN-SITU SEM; INITIAL DEFECTS; MECHANICAL RESPONSE; POWER-LAW; SELECTIVE ETCHING; SIZE EFFECTS; SPIRAL SOURCES; SUBMICROMETERS; SUBMICRON;

DEFECT DENSITY; DENSITY (SPECIFIC GRAVITY); DISLOCATIONS (CRYSTALS); FIBERS; IN SITU PROCESSING; MECHANICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SIZE DETERMINATION; SURFACE DEFECTS; TENSILE TESTING; TRANSMISSION ELECTRON MICROSCOPY; YIELD STRESS;

SINGLE CRYSTALS;

EID: 83455245164     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.11.005     Document Type: Article

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