Calculating the specific contact resistance from the nanostructure at the interface of silver thick film contacts on n-type silicon

Applied Physics Letters

Volumn 99, Issue 11, 2011, Pages

  Kontermann, Stefan ^a   Preu, Ralf ^a   Willeke, Gerhard ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT INTERFACE; N TYPE SILICON; NANOSCALE SILVER; RESISTANCE MEASUREMENT; SCANNING ELECTRON MICROSCOPY IMAGE; SILICON SURFACES; SILVER CRYSTALS; SPECIFIC CONTACT RESISTANCES; THICK-FILM CONTACT;

CONTACT RESISTANCE; CRYSTALS; INTERFACES (MATERIALS); NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; THICK FILMS;

SILVER;

EID: 80053181546     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3635383     Document Type: Article

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