Quasi-two-dimensional transmission line model (QTD-TLM) for planar ohmic contact studies

IEEE Transactions on Electron Devices

Volumn 49, Issue 1, 2002, Pages 105-111

  Chor, E F ^a,b   Lerdworatawee, Jongrit ^b  

^a IEEE   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Contact resistance; Ohmic contacts; Specific contact resistance

Indexed keywords

CONTACT RESISTANCE; CURRENT CROWDING; CURRENT FLOW; SINGLE SHUNT RESISTOR;

CONFORMAL MAPPING; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; RESISTORS; SEMICONDUCTOR METAL BOUNDARIES; TRANSMISSION LINE THEORY; TWO DIMENSIONAL;

OHMIC CONTACTS;

EID: 0036257326     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.974756     Document Type: Article

References (8)

1. Modeling and measurement of contact resistance
2. Contact resistance in diffused resistors
3. A study of the contacts of a diffused resistor
4. Comparison between analytical models and finite-difference in transmission-line tap resistors and L-type cross-Kelvin resistors
5. Models for contacts to planar devices
6. Obtaining the specific contact resistance from transmission line model measurements