Band alignment of ultra-thin hetero-structure ZnO/TiO2 junction

Materials Research Bulletin

Volumn 51, Issue , 2014, Pages 141-144

  Shen, Kai ^a   Wu, Kunjie ^a   Wang, Deliang ^a,b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

A. Interfaces; A. Oxides; B. Sputtering; C. Photoelectron spectroscopy

Indexed keywords

BAND ALIGNMENTS; BAND OFFSETS; COATING THICKNESS; HIGH RESOLUTION; INTERFACE DIPOLE; TYPE II; ULTRA-THIN; VALENCE BAND OFFSETS; ZNO/TIO;

HETEROJUNCTIONS; PHOTOELECTRONS; THICKNESS MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ALIGNMENT;

EID: 84891525976     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2013.12.013     Document Type: Article

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