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Volumn 114, Issue 23, 2013, Pages

Chemical composition and temperature dependent performance of ZnO-thin film transistors deposited by pulsed and continuous spray pyrolysis

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; CHEMICAL COMPOSITIONS; CONTINUOUS DEPOSITION; DEPOSITION TEMPERATURES; DEVICE CHARACTERISTICS; ELECTRICAL PERFORMANCE; PULSED SPRAY PYROLYSIS; ZINC OXIDE THIN FILMS;

EID: 84891463478     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4846736     Document Type: Article
Times cited : (12)

References (20)
  • 1
    • 21844471536 scopus 로고    scopus 로고
    • UV optical properties of ferromagnetic Mn-doped ZnO thin films grown by PLD
    • 10.1016/j.tsf.2004.11.211
    • M. Diaconu, " UV optical properties of ferromagnetic Mn-doped ZnO thin films grown by PLD.," Thin Solid Films 486, 117-121 (2005). 10.1016/j.tsf.2004.11.211
    • (2005) Thin Solid Films , vol.486 , pp. 117-121
    • Diaconu, M.1
  • 2
    • 78149382528 scopus 로고    scopus 로고
    • Present status of amorphous In-Ga-Zn-O thin-film transistors
    • 10.1088/1468-6996/11/4/044305
    • T. Kamiya, K. Nomura, and H. Hosono, " Present status of amorphous In-Ga-Zn-O thin-film transistors.," Sci. Technol. Adv. Mater. 11, 044305 (2010). 10.1088/1468-6996/11/4/044305
    • (2010) Sci. Technol. Adv. Mater. , vol.11 , pp. 044305
    • Kamiya, T.1    Nomura, K.2    Hosono, H.3
  • 3
    • 84861829395 scopus 로고    scopus 로고
    • Oxide semiconductor thin-film transistors: A review of recent advances
    • 10.1002/adma.201103228
    • E. Fortunato, P. Barquinha, and R. Martins, " Oxide semiconductor thin-film transistors: A review of recent advances.," Adv. Mater. 24, 2945-2986 (2012). 10.1002/adma.201103228
    • (2012) Adv. Mater. , vol.24 , pp. 2945-2986
    • Fortunato, E.1    Barquinha, P.2    Martins, R.3
  • 4
    • 67649252663 scopus 로고    scopus 로고
    • High-performance zinc oxide transistors and circuits fabricated by spray pyrolysis in ambient atmosphere
    • 10.1002/adma.200803584
    • A. Bashir, " High-performance zinc oxide transistors and circuits fabricated by spray pyrolysis in ambient atmosphere.," Adv. Mater. 21, 2226-2231 (2009). 10.1002/adma.200803584
    • (2009) Adv. Mater. , vol.21 , pp. 2226-2231
    • Bashir, A.1
  • 5
    • 84878777725 scopus 로고    scopus 로고
    • Fully patterned low-voltage transparent metal oxide transistors deposited solely by chemical spray pyrolysis
    • 10.1002/adfm.201202334
    • H. Faber, B. Butz, C. Dieker, E. Spiecker, and M. Halik, " Fully patterned low-voltage transparent metal oxide transistors deposited solely by chemical spray pyrolysis.," Adv. Funct. Mater. 23, 2828-2834 (2013). 10.1002/adfm.201202334
    • (2013) Adv. Funct. Mater. , vol.23 , pp. 2828-2834
    • Faber, H.1    Butz, B.2    Dieker, C.3    Spiecker, E.4    Halik, M.5
  • 6
    • 70349667470 scopus 로고    scopus 로고
    • Electronic properties of ZnO field-effect transistors fabricated by spray pyrolysis in ambient air
    • 10.1063/1.3238466
    • G. Adamopoulos, A. Bashir, P. H. Wöbkenberg, D. D. C. Bradley, and T. D. Anthopoulos, " Electronic properties of ZnO field-effect transistors fabricated by spray pyrolysis in ambient air.," Appl. Phys. Lett. 95, 133507 (2009). 10.1063/1.3238466
    • (2009) Appl. Phys. Lett. , vol.95 , pp. 133507
    • Adamopoulos, G.1    Bashir, A.2    Wöbkenberg, P.H.3    Bradley, D.D.C.4    Anthopoulos, T.D.5
  • 7
    • 79551655262 scopus 로고    scopus 로고
    • Structural and electrical characterization of ZnO films grown by spray pyrolysis and their application in thin-film transistors
    • 10.1002/adfm.201001089
    • G. Adamopoulos, " Structural and electrical characterization of ZnO films grown by spray pyrolysis and their application in thin-film transistors.," Adv. Funct. Mater. 21, 525-531 (2011). 10.1002/adfm. 201001089
    • (2011) Adv. Funct. Mater. , vol.21 , pp. 525-531
    • Adamopoulos, G.1
  • 8
    • 0020824011 scopus 로고
    • Infrared rapid thermal annealing for GaAs device fabrication
    • 10.1063/1.332767
    • H. Kohzu, M. Kuzuhara, and Y. Takayama, " Infrared rapid thermal annealing for GaAs device fabrication.," J. Appl. Phys. 54, 4998-5002 (1983). 10.1063/1.332767
    • (1983) J. Appl. Phys. , vol.54 , pp. 4998-5002
    • Kohzu, H.1    Kuzuhara, M.2    Takayama, Y.3
  • 9
    • 84865737334 scopus 로고    scopus 로고
    • Flexible metal-oxide devices made by room-temperature photochemical activation of sol-gel films
    • 10.1038/nature11434
    • Y.-H. Kim, " Flexible metal-oxide devices made by room-temperature photochemical activation of sol-gel films.," Nature 489, 128-132 (2012). 10.1038/nature11434
    • (2012) Nature , vol.489 , pp. 128-132
    • Kim, Y.-H.1
  • 10
    • 36249020937 scopus 로고    scopus 로고
    • Microwave annealing of polymer photovoltaic devices
    • 10.1002/adma.200700741
    • C.-J. Ko, Y.-K. Lin, and F.-C. Chen, " Microwave annealing of polymer photovoltaic devices.," Adv. Mater. 19, 3520-3523 (2007). 10.1002/adma.200700741
    • (2007) Adv. Mater. , vol.19 , pp. 3520-3523
    • Ko, C.-J.1    Lin, Y.-K.2    Chen, F.-C.3
  • 12
    • 0000427408 scopus 로고
    • Morphological stability analysis in chemical vapour deposition processes. i
    • 10.1016/0022-0248(78)90395-0
    • C. H. J. Van den Brekel and A. K. Jansen, " Morphological stability analysis in chemical vapour deposition processes. I.," J. Cryst. Growth 43, 364-370 (1978). 10.1016/0022-0248(78)90395-0
    • (1978) J. Cryst. Growth , vol.43 , pp. 364-370
    • Van Den Brekel, C.H.J.1    Jansen, A.K.2
  • 13
    • 84888370227 scopus 로고    scopus 로고
    • Leidenfrost temperature related CVD-like growth mechanism in ZnO-TFTs deposited by pulsed spray pyrolysis
    • 10.1016/j.jcrysgro.2012.10.043
    • M. Ortel and V. Wagner, " Leidenfrost temperature related CVD-like growth mechanism in ZnO-TFTs deposited by pulsed spray pyrolysis.," J. Cryst. Growth 363, 185-189 (2013). 10.1016/j.jcrysgro.2012.10.043
    • (2013) J. Cryst. Growth , vol.363 , pp. 185-189
    • Ortel, M.1    Wagner, V.2
  • 14
    • 4444223813 scopus 로고    scopus 로고
    • XPS MultiQuant: Multimodel XPS quantification software
    • 10.1002/sia.1775
    • M. Mohai, " XPS MultiQuant: Multimodel XPS quantification software.," Surf. Interface Anal. 36, 828-832 (2004). 10.1002/sia.1775
    • (2004) Surf. Interface Anal. , vol.36 , pp. 828-832
    • Mohai, M.1
  • 15
    • 0032049805 scopus 로고    scopus 로고
    • Optical properties of zinc oxynitride thin films
    • 10.1016/S0040-6090(97)00646-9
    • M. Futsuhara, K. Yoshioka, and O. Takai, " Optical properties of zinc oxynitride thin films.," Thin Solid Films 317, 322-325 (1998). 10.1016/S0040-6090(97)00646-9
    • (1998) Thin Solid Films , vol.317 , pp. 322-325
    • Futsuhara, M.1    Yoshioka, K.2    Takai, O.3
  • 16
    • 34047152800 scopus 로고    scopus 로고
    • The chemistry and physics of zinc oxide surfaces
    • 10.1016/j.progsurf.2006.12.002
    • C. Woell, " The chemistry and physics of zinc oxide surfaces.," Prog. Surf. Sci. 82, 55-120 (2007). 10.1016/j.progsurf.2006.12.002
    • (2007) Prog. Surf. Sci. , vol.82 , pp. 55-120
    • Woell, C.1
  • 17
    • 0001526822 scopus 로고
    • Factors influencing the chemical vapor deposition of oriented ZnO films using zinc acetate
    • 10.1021/cm00058a020
    • G. L. Mar, P. Y. Timbrell, and R. N. Lamb, " Factors influencing the chemical vapor deposition of oriented ZnO films using zinc acetate.," Chem. Mater. 7, 1890-1896 (1995). 10.1021/cm00058a020
    • (1995) Chem. Mater. , vol.7 , pp. 1890-1896
    • Mar, G.L.1    Timbrell, P.Y.2    Lamb, R.N.3
  • 19
    • 29144441467 scopus 로고    scopus 로고
    • Zinc oxide nanoparticles with defects
    • 10.1002/adfm.200500087
    • V. Ischenko, " Zinc oxide nanoparticles with defects.," Adv. Funct. Mater. 15, 1945-1954 (2005). 10.1002/adfm.200500087
    • (2005) Adv. Funct. Mater. , vol.15 , pp. 1945-1954
    • Ischenko, V.1
  • 20
    • 0001142560 scopus 로고    scopus 로고
    • Excimer laser annealing of amorphous and solid-phase-crystallized silicon films
    • 10.1063/1.371560
    • M. Miyasaka and J. Stoemenos, " Excimer laser annealing of amorphous and solid-phase-crystallized silicon films.," J. Appl. Phys. 86, 5556 (1999). 10.1063/1.371560
    • (1999) J. Appl. Phys. , vol.86 , pp. 5556
    • Miyasaka, M.1    Stoemenos, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.