Identification of defect levels in CdTe/CdS solar cells using deep level transient spectroscopy

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 736-737

  Komin, V ^a   Viswanathan, V ^a   Tetali, B ^a   Morel, D L ^a   Ferekides, C S ^a  

^a University of South Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM SULFIDE; CHLORINE COMPOUNDS; COMPOSITION EFFECTS; CRYSTAL DEFECTS; DEEP LEVEL TRANSIENT SPECTROSCOPY; DEGRADATION; ELECTRON TRAPS; HOLE TRAPS; IMPURITIES; SEMICONDUCTING CADMIUM TELLURIDE;

BACK CONTACTS; DEFECT LEVELS; DEVICE DEGRADATION; PROCESS VARIATIONS;

SOLAR CELLS;

EID: 0036956806     PISSN: 01608371     EISSN: None     Source Type: Journal    
DOI: 10.1109/PVSC.2002.1190670     Document Type: Article

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