Effect of oxide thin films in back contact on the optical absorption efficiency of thin crystalline Si solar cells

Current Applied Physics

Volumn 13, Issue 4 SUPPL.2, 2013, Pages

  Byun, Seok Yong ^a,c   Byun, Seok Joo ^a   Lee, Taek Sung ^b   Sheen, Dongwoo ^c   Jeong, Jeung Hyun ^b   Kim, Won Mok ^b  

^a Insideoptics Co Ltd   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

^c Seoul National University   (South Korea)

Author keywords

Back contact; Optical absorption efficiency; Oxide thin films; Ray tracing; Thin crystalline Si solar cells

Indexed keywords

ALUMINUM; CRYSTALLINE MATERIALS; EFFICIENCY; ELECTRODES; II-VI SEMICONDUCTORS; LIGHT ABSORPTION; OXIDE FILMS; RAY TRACING; REFRACTIVE INDEX; SILICON; SILVER; SOLAR CELLS; THIN FILMS; THREE DIMENSIONAL COMPUTER GRAPHICS; ZINC OXIDE;

ABSORPTION EFFICIENCY; BACK CONTACT; CALCULATION ALGORITHMS; CRYSTALLINE SI SOLAR CELLS; EXTINCTION COEFFICIENTS; OXIDE THIN FILMS; THREE-DIMENSIONAL MODEL; TOTAL INTERNAL REFLECTIONS;

SILICON SOLAR CELLS;

EID: 84890555589     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2013.01.045     Document Type: Article

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