SXPS studies of single crystalline CdTe/CdS interfaces

Journal of Electron Spectroscopy and Related Phenomena

Volumn 190, Issue PART A, 2013, Pages 54-63

  Siepchen, B ^a   Schimper, H J ^a   Klein, A ^a   Jaegermann, W ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

CdTe; II VI semiconductor; Interfaces; Solar cell; Thin film; XPS

Indexed keywords

CDTE; CONDUCTION BAND OFFSET; II-VI SEMICONDUCTOR; PHOTOEMISSION MEASUREMENTS; SINGLE CRYSTAL SUBSTRATES; SURFACE CORE LEVEL SHIFTS; THIN FILM SOLAR CELLS; VALENCE BAND OFFSETS;

CADMIUM SULFIDE; CADMIUM TELLURIDE; HETEROJUNCTIONS; SOLAR CELLS; SUBSTRATES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

INTERFACES (MATERIALS);

EID: 84890128468     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2013.05.004     Document Type: Article

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