Properties of sputtered ZnO films and its interfaces with CdS

Thin Solid Films

Volumn 431-432, Issue , 2003, Pages 378-381

  Sauberlich F ^a   Fritsche, J ^a   Hunger, R ^a   Klein, A ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Cadmium sulphide; Interfaces; X ray photoelectron spectroscopy; Zinc oxide

Indexed keywords

CADMIUM SULFIDE; ELECTRONIC PROPERTIES; EVAPORATION; INTERFACES (MATERIALS); MAGNETRON SPUTTERING; SPUTTER DEPOSITION; SYNCHROTRON RADIATION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL BATH DEPOSITION (CBD);

ZINC OXIDE;

EID: 0037680521     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00251-7     Document Type: Conference Paper

References (7)

1. Rau U., Schock H.W. Appl. Phys. A. 69:1999;131.
2. Klenk R. Thin Solid Films. 387:2001;135.
3. C. Wöll, personal communication.
4. Schön G. J. Electr. Spectr. Rel. Phen. 2:1973;75.
5. Fritsche J., Gunst S., Thißen A., Gegenwart R., Klein A., Jaegermann W. Mater. Res. Soc. Symp. Proc. 668:2001;H5.1.
6. Ruckh M., Schmid D., Schock H.W. J. Appl. Phys. 76:1994;5945.
7. Zhang S.B., Wei S.-H., Zunger A. J. Appl. Phys. 83:1998;3192.