Utilization of sputter depth profiling for the determination of band alignment at polycrystalline CdTe/CdS heterointerfaces

Applied Physics Letters

Volumn 81, Issue 12, 2002, Pages 2297-2299

  Fritsche, J ^a   Schulmeyer, T ^a   Kraft, D ^a   Thissen A ^a   Klein, A ^a   Jaegermann, W ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BAND ALIGNMENTS; CDS; CDS/CDTE; CDTE; CDTE/CDS; HETERO-INTERFACES; POLYCRYSTALLINE; SPUTTER-DEPTH PROFILING; THIN-FILM SOLAR CELLS; VALENCE BAND OFFSETS;

ALIGNMENT; CADMIUM COMPOUNDS; CADMIUM SULFIDE; PHOTOELECTRON SPECTROSCOPY;

DEPTH PROFILING;

EID: 79956043393     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1507830     Document Type: Article

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