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Journal of Electron Spectroscopy and Related Phenomena

Volumn 190, Issue PART B, 2013, Pages 222-227

Hard X-ray photoemission spectroscopy of transition-metal oxide thin films and interfaces

(2) Wadati, H a Fujimori, A a

a UNIVERSITY OF TOKYO (Japan)

Author keywords

Hard X ray photoemission spectroscopy; Interfaces; Multilayers; Thin films; Transition metal oxides

Indexed keywords

BULK STATE; COMPOSITION DEPENDENCE; EXPERIMENTAL TECHNIQUES; HARD X-RAY PHOTOEMISSION SPECTROSCOPY; INTERFACIAL ELECTRONIC STRUCTURE; OXIDE THIN FILMS; THICKNESS DEPENDENCE; TRANSITION-METAL OXIDES;

ELECTRONIC STRUCTURE; FILM PREPARATION; INTERFACES (MATERIALS); MULTILAYERS; PHOTOELECTRON SPECTROSCOPY; THIN FILMS; TRANSITION METALS;

X RAYS;

EID: 84890119871 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2013.08.010 Document Type: Article

Times cited : (8)

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