Thickness dependent electronic structure of La0.6Sr 0.4MnO3 layer in SrTiO3/La0.6Sr 0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy

Applied Physics Letters

Volumn 94, Issue 7, 2009, Pages

  Yoshimatsu, K ^a   Horiba, K ^a,b   Kumigashira, H ^a,b   Ikenaga, E ^c   Oshima, M ^a,b  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; LANTHANUM; LUMINESCENCE OF ORGANIC SOLIDS; MANGANESE; MANGANESE COMPOUNDS; METAL INSULATOR BOUNDARIES; PHOTOEMISSION; POTENTIAL ENERGY; POTENTIAL ENERGY SURFACES; SEMICONDUCTOR INSULATOR BOUNDARIES; STRONTIUM ALLOYS;

HARD X-RAY PHOTOEMISSION SPECTROSCOPIES; HETEROSTRUCTURES; INTERFACE REGIONS; LAYER THICKNESS; METAL-INSULATOR TRANSITIONS; NON-MAGNETIC; TRANSITION LAYERS;

METAL INSULATOR TRANSITION;

EID: 60749110453     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3081016     Document Type: Article

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