Thickness-dependent electronic structure of ultrathin SrRu O3 films studied by in situ photoemission spectroscopy

Applied Physics Letters

Volumn 87, Issue 16, 2005, Pages 1-3

  Toyota, D ^a   Ohkubo, I ^a   Kumigashira, H ^a   Oshima, M ^a   Ohnishi, T ^a   Lippmaa, M ^a   Takizawa, M ^a   Fujimori, A ^a   Ono, K ^b   Kawasaki, M ^c   Koinuma, H ^d  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; FILM GROWTH; MAGNETIC PROPERTIES; SPECTROSCOPIC ANALYSIS;

CRITICAL FILM THICKNESS; GROWTH-MODE TRANSITION; STRUCTURE-INDUCED EVOLUTION;

STRONTIUM COMPOUNDS;

EID: 28344445429     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2108123     Document Type: Article

References (23)

1. J. F. Scott, Ferroelectric Memories (Springer, Berlin, 2000).
2. S. C. Gausepohl, M. Lee, L. Antognazza, and K. Char, Appl. Phys. Lett. 67, 1313 (1995).
3. K. S. Takahashi, A. Sawa, Y. Ishii, H. Akoh, M. Kawasaki, and Y. Tokura, Phys. Rev. B 67, 094413 (2003).
4. T. Fujii, M. Kawasaki, A. Sawa, H. Akoh, Y. Kawazoe, and Y. Tokura, Appl. Phys. Lett. 86, 012107 (2005).
5. J. Z. Sun, D. W. Abraham, R. A. Rao, and C. B. Eom, Appl. Phys. Lett. 74, 3017 (1999).
6. H. Yamada, M. Kawasaki, Y. Ogawa, and Y. Tokura, Appl. Phys. Lett. 81, 4793 (2002).
7. G. Herranz, B. Martinez, J. Fontcuberta, F. Sanchez, C. Ferrater, M. V. Garcia-Cuenca, and M. Varela, Phys. Rev. B 67, 174423 (2003).
8. G. Herranz, B. Martinez, J. Fontcuberta, F. Sanchez, M. V. Garcia-Cuenca, C. Ferrater, and M. Varela, Appl. Phys. Lett. 82, 85 (2003).
9. M. Imada, A. Fujimori, and Y. Tokura, Rev. Mod. Phys. 70, 1039 (1998).
10. K. Horiba, H. Ohguchi, H. Kumigashira, M. Oshima, K. Ono, N. Nakagawa, M. Lippmaa, M. Kawasaki, and H. Koinuma, Rev. Sci. Instrum. 74, 3406 (2003).
11. M. Kawasaki, K. Takahashi, T. Maeda, R. Tsuchiya, M. Shinohara, O. Ishiyama, T. Yonezawa, M. Yoshimoto, and H. Koinuma, Science 266, 1540 (1994).
12. H. Kumigashira, D. Kobayashi, R. Hashimoto, A. Chikamatsu, M. Oshima, N. Nakagawa, T. Ohnishi, M. Lippmaa, H. Wadati, A. Fujimori, K. Ono, M. Kawasaki, and H. Koinuma, Appl. Phys. Lett. 84, 5353 (2004).
13. E. Vasco, R. Dittmann, S. Karthauser, and R. Waser, Appl. Phys. Lett. 82, 2497 (2003).
14. F. Sanchez, G. Herranz, I. C. Infante, J. Fontcuberta, M. V. Garcia-Cuenca, C. Ferrater, and M. Varela, Appl. Phys. Lett. 85, 1981 (2004).
15. F. Sanchez, M. V. Garcia-Cuenca, C. Ferrater, M. Varela, G. Herranz, B. Martinez, and J. Fontcuberta, Appl. Phys. Lett. 83, 902 (2003).
16. G. Rijnders, D. H. A. Blank, J. Choi, and C. B. Eom, Appl. Phys. Lett. 84, 505 (2004).
17. J. Choi, C. B. Eom, G. Rijnders, H. Rogalla, and D. H. A. Blank, Appl. Phys. Lett. 79, 1447 (2001).
18. J. Okamoto, T. Mizokawa, A. Fujimori, I. Hase, M. Nohara, H. Takagi, Y. Takeda, and M. Takano, Phys. Rev. B 60, 2281 (1999).
19. D. Kobayashi, H. Kumigashira, M. Oshima, T. Ohnishi, M. Lippmaa, K. Ono, M. Kawasaki, and H. Koinuma, J. Appl. Phys. 96, 7183 (2004).
20. K. W. Kim, J. S. Lee, T. W. Noh, S. R. Lee, and K. Char, Phys. Rev. B 71, 125104 (2005).
21. M. Takizawa, D. Toyota, H. Wadati, A. Chikamatsu, H. Kumigashira, A. Fujimori, M. Oshima, Z. Fang, M. Lippmaa, M. Kawasaki, and H. Koinuma, Phys. Rev. B 72, 060404 (R) (2005).
22. J. Kim, J. Chung, and S.-J. Oh, Phys. Rev. B 71, 121406 (2005).
23. J. Park, S.-J. Oh, J.-H. Park, D. M. Kim, and C.-B. Eom, Phys. Rev. B 69, 085108 (2004).