Laser-induced fault simulation

Proceedings - 16th Euromicro Conference on Digital System Design, DSD 2013

Volumn , Issue , 2013, Pages 609-614

  Lu, Feng ^a   Di Natale, Giorgio ^a   Flottes, Marie Lise ^a   Rouzeyre, Bruno ^a  

^a LIRMM   (France)

Author keywords

Layout oriented fault simulation; Multi level fault simulation; PLS effects

Indexed keywords

FAULT SIMULATION; LARGE CIRCUITS; LASER INDUCED; LAYOUT INFORMATION; MULTI-LEVEL PROCESS; PHYSICAL PHENOMENA; PLS EFFECTS; TRANSISTOR LEVEL;

SYSTEMS ANALYSIS;

EID: 84890022722     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DSD.2013.72     Document Type: Conference Paper

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