Structured illumination fluorescence microscopy with distorted excitations using a filtered blind-SIM algorithm

Optics Letters

Volumn 38, Issue 22, 2013, Pages 4723-4726

  Ayuk, R ^a   Giovannini, H ^a   Jost, A ^c,d   Mudry, E ^a   Girard, J ^a   Mangeat, T ^b   Sandeau, N ^a   Heintzmann, R ^c,d   Wicker, K ^c,d   Belkebir, K ^a   Sentenac, A ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b UNIVERSITÉ PAUL SABATIER   (France)

^c Institute of Photonic Technologies   (Germany)

^d FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITATION PATTERN; PRIORI INFORMATION; RECONSTRUCTION ALGORITHMS; STRUCTURED ILLUMINATION; STRUCTURED ILLUMINATION MICROSCOPIES (SIM);

FLUORESCENCE MICROSCOPY;

ALGORITHMS;

ALGORITHM; ARTICLE; ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; FLUORESCENCE MICROSCOPY; ILLUMINATION; IMAGE ENHANCEMENT; METHODOLOGY;

ALGORITHMS; ARTIFACTS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIGHTING; MICROSCOPY, FLUORESCENCE;

EID: 84887969115     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.38.004723     Document Type: Article

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