Phase optimisation for structured illumination microscopy

Optics Express

Volumn 21, Issue 2, 2013, Pages 2032-2049

  Wicker, Kai ^a,b,c   Mandula, Ondrej ^d   Best, Gerrit ^e,f   Fiolka, Reto ^g   Heintzmann, Rainer ^a,b,c  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

^c KING'S COLLEGE LONDON   (United Kingdom)

^d UNIVERSITY OF EDINBURGH   (United Kingdom)

^e UNIVERSITY HOSPITAL HEIDELBERG   (Germany)

^f UNIVERSITY OF HEIDELBERG   (Germany)

^g HOWARD HUGHES MEDICAL INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL RESOLVING POWER; OPTIMIZATION;

CROSS-CORRELATIONS; FLUORESCENCE IMAGING; HIGH PRECISION; OPTIMISATIONS; PATTERN POSITION; PERIODIC LIGHT PATTERNS; PHASE INFORMATION; POSTERIORI; ROBUST ALGORITHM; STRUCTURED ILLUMINATION MICROSCOPY; SUPER RESOLUTION;

ITERATIVE METHODS;

ALGORITHM; ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; FLUORESCENCE MICROSCOPY; ILLUMINATION; IMAGE ENHANCEMENT; MICROSCOPY; PHASE CONTRAST MICROSCOPY; THREE DIMENSIONAL IMAGING;

ALGORITHMS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGING, THREE-DIMENSIONAL; LIGHTING; MICROSCOPY; MICROSCOPY, FLUORESCENCE; MICROSCOPY, PHASE-CONTRAST;

MLCS; MLOWN;

EID: 84874037857     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.21.002032     Document Type: Article

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