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Volumn , Issue , 2013, Pages 1724-1729

Locating end-effector tips in automated micromanipulation

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE CONTOURS; EFFECT OF FACTORS; FIELD OF VIEWS; MICRO MANIPULATION; MICRO MANIPULATION SYSTEMS; MOTION HISTORY IMAGES; PROCESSING PARAMETERS; QUANTITATIVE RESULT;

EID: 84887282095     PISSN: 10504729     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICRA.2013.6630803     Document Type: Conference Paper
Times cited : (5)

References (14)
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    • Yi, S.1    Labate, D.2    Easley, G.R.3    Krim, H.4
  • 9
    • 70349127296 scopus 로고    scopus 로고
    • Automatic particle detection and counting by one-class SVM from microscope Image
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.