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Volumn 5507 LNCS, Issue PART 2, 2009, Pages 361-368
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Automatic particle detection and counting by one-class SVM from microscope image
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATIC PARTICLE COUNTING METHOD;
AUTOMATIC PARTICLE DETECTION;
FALSE POSITIVE;
HUMAN INSPECTORS;
IN-BUILDINGS;
INPUT SAMPLE;
MICROSCOPE IMAGES;
ONE CLASS-SVM;
ONE-CLASS SUPPORT VECTOR MACHINE;
BUILDING MATERIALS;
CONSTRUCTION EQUIPMENT;
DATA PROCESSING;
SUPPORT VECTOR MACHINES;
ASBESTOS;
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EID: 70349127296
PISSN: 03029743
EISSN: 16113349
Source Type: Book Series
DOI: 10.1007/978-3-642-03040-6_44 Document Type: Conference Paper |
Times cited : (11)
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References (12)
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