Role of humidity and oxygen level on damage to DNA induced by soft X-rays and low-energy electrons

Journal of Physical Chemistry C

Volumn 117, Issue 43, 2013, Pages 22445-22453

  Alizadeh, Elahe ^a   Sanche, Léon ^a  

^a UNIVERSITY OF SHERBROOKE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DOUBLE-STRAND BREAKS; EXPERIMENTAL PARAMETERS; LOW ENERGY ELECTRONS; OXYGEN LEVELS; OXYGENATED ENVIRONMENTS; PLASMID DNA; TEMPERATURE AND PRESSURES; X RAY PHOTONS;

ELECTRONS; OXYGEN;

X RAYS;

EID: 84887140308     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp403350j     Document Type: Article

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