Low-energy electron diffraction and induced damage in hydrated DNA

Journal of Chemical Physics

Volumn 128, Issue 19, 2008, Pages

  Orlando, Thomas M ^a   Oh, Doogie ^a   Chen, Yanfeng ^a   Aleksandrov, Alexandr B ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELASTIC SCATTERING; ELECTRIC EXCITATION; HYDRATION; IONIZATION; LOW ENERGY ELECTRON DIFFRACTION; PHOSPHATES;

DIFFRACTION INTENSITY; DISSOCIATIVE IONIZATION; HYDRATED DNA; STRUCTURAL WATERS; SUGAR-PHOSPHATE BACKBONE;

DNA;

DNA; DNA A; OLIGONUCLEOTIDE;

ARTICLE; BIOPHYSICS; CHEMICAL STRUCTURE; CHEMISTRY; CONFORMATION; DNA DAMAGE; ELECTRON; METHODOLOGY; PHYSICAL CHEMISTRY; RADIATION SCATTERING;

BIOPHYSICS; CHEMISTRY, PHYSICAL; DNA; DNA DAMAGE; DNA, A-FORM; ELECTRONS; MODELS, MOLECULAR; MOLECULAR CONFORMATION; NUCLEIC ACID CONFORMATION; OLIGONUCLEOTIDES; SCATTERING, RADIATION;

EID: 44349176007     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2907722     Document Type: Article

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