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Volumn 3, Issue 45, 2013, Pages 23649-23657

Surface band structure of aryl-diazonium modified p-Si electrodes determined by X-ray photoelectron spectroscopy and electrochemical measurements

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL MEASUREMENTS; ELECTROCHEMICAL METHODS; GRAFTING METHOD; INTERFACIAL PROPERTY; P-TYPE SILICON; SILICON SURFACES; SURFACE BAND STRUCTURES; XPS MEASUREMENTS;

EID: 84886849300     PISSN: None     EISSN: 20462069     Source Type: Journal    
DOI: 10.1039/c3ra44366c     Document Type: Article
Times cited : (13)

References (47)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.