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Volumn 3, Issue 45, 2013, Pages 23649-23657
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Surface band structure of aryl-diazonium modified p-Si electrodes determined by X-ray photoelectron spectroscopy and electrochemical measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROCHEMICAL MEASUREMENTS;
ELECTROCHEMICAL METHODS;
GRAFTING METHOD;
INTERFACIAL PROPERTY;
P-TYPE SILICON;
SILICON SURFACES;
SURFACE BAND STRUCTURES;
XPS MEASUREMENTS;
BAND STRUCTURE;
INFRARED SPECTROSCOPY;
INTERFACIAL ENERGY;
PHOTOELECTRONS;
SILICON;
SILICON OXIDES;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 84886849300
PISSN: None
EISSN: 20462069
Source Type: Journal
DOI: 10.1039/c3ra44366c Document Type: Article |
Times cited : (13)
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References (47)
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