Functions for quality transition fault tests

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn , Issue , 2005, Pages 327-332

  Michael, Maria K ^a   Neophytou, Stelios ^a   Tragoudas, Spyros ^b  

^a UNIVERSITY OF CYPRUS   (Cyprus)

^b SOUTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPACTION METHODS; FAULT SITES; QUALITY TEST; SYSTEMATIC METHODOLOGY; TRANSITION FAULT TESTS; TRANSITION FAULTS;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 84886679995     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2005.60     Document Type: Conference Paper

References (15)

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